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Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits.

Matteo BuffoloM. PietrobonCarlo De SantiF. SamparisiMichael L. DavenportJohn E. BowersGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini
Published in: Microelectron. Reliab. (2018)
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