Cache-resident self-testing for I/O circuitry.
Sankar GurumurthyD. BertanzettiP. JakobsenJeff RearickPublished in: ITC (2009)
Keyphrases
- main memory
- garbage collection
- input output
- cache misses
- cache conscious
- disk array
- buffer pool
- test cases
- smart home
- database workloads
- replacement policy
- data structure
- virtual memory
- read write
- back end
- prefetching
- secondary storage
- memory access
- random access
- database management systems
- gigabit ethernet
- database systems