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LOT-ECC: Localized and tiered reliability mechanisms for commodity memory systems.

Aniruddha N. UdipiNaveen MuralimanoharRajeev BalasubramonianAl DavisNorman P. Jouppi
Published in: ISCA (2012)
Keyphrases
  • complex systems
  • building blocks
  • learning systems
  • computational systems
  • real time
  • data mining
  • expert systems
  • management system
  • distributed systems
  • retrieval systems
  • memory usage
  • computing power