A fast algorithm for detecting die extrusion defects in IC packages.

H. Zhou Ashraf A. Kassim Surendra Ranganath

Published in: Mach. Vis. Appl. (1998)

Keyphrases

integrated circuit
defect detection
automated visual inspection
databases
metadata
preprocessing
automatically detecting
database
real time
real world
relational databases
artificial neural networks
multiresolution
vision system
automatic detection