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Solving the Third-Shift Problem in IC Piracy With Test-Aware Logic Locking.

Stephen M. PlazaIgor L. Markov
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2015)
Keyphrases
  • classical logic
  • logic programming
  • modal logic
  • information systems
  • multi valued
  • neural network
  • genetic algorithm
  • database systems
  • test data
  • statistical tests
  • automated reasoning