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Solving the Third-Shift Problem in IC Piracy With Test-Aware Logic Locking.
Stephen M. Plaza
Igor L. Markov
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2015)
Keyphrases
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classical logic
logic programming
modal logic
information systems
multi valued
neural network
genetic algorithm
database systems
test data
statistical tests
automated reasoning