Noise as Diagnostic Tool for Quality and Reliability of MEMS.
Faisal Mohd-YasinDavid J. NagelPublished in: Sensors (2021)
Keyphrases
- diagnostic tool
- high quality
- noise level
- quality assessment
- reliability analysis
- spect images
- higher quality
- image noise
- poor quality
- noise model
- low quality
- noisy data
- missing data
- noisy environments
- cost effectiveness
- quality attributes
- noise sensitivity
- quality measures
- computer vision
- noise reduction
- signal to noise ratio
- image quality
- input data
- software development
- feature vectors
- feature space
- decision trees