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Productivity Improvement on Functional Test of Integrated Circuits Device Under High Temperature Condition.

Krisada AsawarungsaengkulSakchai Chitharn
Published in: DaEng (2015)
Keyphrases
  • integrated circuit
  • high temperature
  • built in self test
  • sufficient conditions
  • software development
  • statistical significance
  • neuro fuzzy
  • metal oxide semiconductor