Analysis of BTI in 300 mm integrated dual-gate WS2 FETs.

L. Panarella Quentin Smets D. Verreck Tom Schram Daire Cott I. Asselberghs Ben Kaczer

Published in: DRC (2022)

Keyphrases

image segmentation
data mining
feature selection
three dimensional
statistical analysis
service oriented
databases
artificial intelligence
search engine
clustering algorithm
data analysis
medical images
low power
mathematical analysis
average error