Elimination of the Background of Electron Microscope Images by Using FPGA.

Ádám Fazekas Hiroshi Daimon Hiroyuki Matsuda László Tóth

Published in: Acta Cybern. (2013)

Keyphrases

microscope images
cross sections
automatic segmentation
scale invariant
fully automatic
cross section
electron microscopy
image processing
multiscale
binary images