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Novel Spectral Methods for Built-In Self-Test in a System-on-a-Chip Environment.

Ashish GianiShuo ShengMichael S. HsiaoVishwani D. Agrawal
Published in: VTS (2001)
Keyphrases
  • spectral methods
  • built in self test
  • spectral analysis
  • random walk
  • manifold learning
  • data mining