Feasibility of picosecond electrical sampling using GaAs FET.
Habiba HafdallahAchour OuslimaniRobert AddeGuy VernetPaul CrozatPublished in: IEEE Trans. Instrum. Meas. (2000)
Keyphrases
- field effect transistors
- integrated circuit
- random sampling
- sampling algorithm
- gallium arsenide
- monte carlo
- sampling strategy
- injection lasers
- sample size
- sampling rate
- physical characteristics
- transmission line
- differential equations
- parameter space
- sampling methods
- information systems
- room temperature
- distribution networks
- low voltage
- active learning
- sparse sampling
- multiscale
- website