Optimizing error masking in BIST by output data modification.
Yervant ZorianVinod K. AgarwalPublished in: J. Electron. Test. (1990)
Keyphrases
- data sets
- data analysis
- data collection
- synthetic data
- data structure
- database
- input data
- statistical analysis
- data sources
- high dimensional data
- experimental data
- original data
- image data
- error rate
- data distribution
- missing values
- input variables
- small number
- prior knowledge
- database systems
- data objects
- noisy data
- data quality