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Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction.
Vincenzo Della Marca
Jérémy Postel-Pellerin
T. Kempf
Arnaud Régnier
Philippe Chiquet
Marc Bocquet
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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high speed
input parameters
low power
knowledge extraction
equivalent circuit
correlation coefficient
sensitivity analysis
maximum likelihood estimation
database
artificial neural networks
expectation maximization
parameter space
probability density function
automatic extraction
parameter selection