Built-In Self Test of CMOS-MEMS Accelerometers.
Nilmoni DebR. D. (Shawn) BlantonPublished in: ITC (2002)
Keyphrases
- built in self test
- analog to digital converter
- integrated circuit
- high speed
- power consumption
- low cost
- analog vlsi
- low power
- delay insensitive
- image sensor
- power supply
- vlsi circuits
- low voltage
- hd video
- circuit design
- neural network
- real time
- signature verification
- cmos image sensor
- physical activity
- cmos technology
- focal plane
- case study
- search engine
- data sets