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Slew-Rate Monitoring Circuit for On-Chip Process Variation Detection.
Amlan Ghosh
Rahul M. Rao
Jae-Joon Kim
Ching-Te Chuang
Richard B. Brown
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2013)
Keyphrases
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high speed
automatic detection
real time
anomaly detection
detection algorithm
object detection
low cost
false alarms
circuit design
genetic algorithm
detection method