Improve Semi-supervised Learning with Metric Learning Clusters and Auxiliary Fake Samples.
Wei ZhouCheng LianZhigang ZengBingrong XuYixin SuPublished in: Neural Process. Lett. (2021)
Keyphrases
- semi supervised learning
- metric learning
- semi supervised
- semi supervised clustering
- unlabeled data
- labeled data
- distance metric learning
- unsupervised learning
- semi supervised classification
- supervised learning
- semi definite programming
- distance metric
- learning problems
- unsupervised clustering
- data sets
- kernel matrix
- learning tasks
- pairwise constraints
- active learning
- pairwise
- multi task
- clustering algorithm
- machine learning
- discriminative information
- semi supervised learning setting
- learning models
- text categorization
- image segmentation
- distance function
- multiple instance learning
- labeled and unlabeled data
- data points
- pattern recognition
- training data
- transfer learning
- dimensionality reduction
- principal component analysis
- learning process
- support vector