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Band-gap circuit design challenges in high-performance 32-nm technology.

James F. BullerJay FletcherSteven MeyersMoises E. RobinsonFrancisco TamayoAmit PrakashDru Cabler
Published in: CICC (2011)
Keyphrases
  • circuit design
  • nm technology
  • lessons learned
  • design automation
  • key issues
  • digital circuits
  • real time
  • power consumption
  • frequency band
  • image processing
  • case study