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Design of charge pump circuit with consideration of gate-oxide reliability in low-voltage CMOS processes.
Ming-Dou Ker
Shih-Lun Chen
Chia-Sheng Tsai
Published in:
IEEE J. Solid State Circuits (2006)
Keyphrases
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cmos technology
low voltage
leakage current
low power
design considerations
power dissipation
power consumption
circuit design
parallel processing
power line
real time
low cost
image sensor
high speed
mixed signal
nm technology
silicon on insulator
random access memory
digital signal processing