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True constant temperature measurement system for lifetime tests of metallic interconnections of IC's.

Carmine CiofiRomano GiannettiBruno Neri
Published in: IEEE Trans. Instrum. Meas. (1998)
Keyphrases
  • energy consumption
  • data sets
  • statistical tests
  • high density
  • computer vision
  • multiple choice
  • real time
  • databases
  • real world
  • decision trees
  • hidden markov models
  • infrared
  • relative humidity