Impact of temperature fluctuations on circuit characteristics in 180nm and 65nm CMOS technologies.
Ranjith KumarVolkan KursunPublished in: ISCAS (2006)
Keyphrases
- cmos technology
- silicon on insulator
- metal oxide semiconductor
- nm technology
- low power
- power consumption
- high speed
- circuit design
- low voltage
- analog vlsi
- parallel processing
- low cost
- data mining
- power reduction
- transmission electron microscopy
- mixed signal
- power dissipation
- main factors
- integrated circuit
- neural network
- legal issues
- delay insensitive
- real time
- single chip
- design considerations