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Fast RTL Fault Simulation Using Decision Diagrams and Bitwise Set Operations.

Uljana ReinsaluJaan RaikRaimund UbarPeeter Ellervee
Published in: DFT (2011)
Keyphrases
  • decision diagrams
  • multiple valued
  • markov decision processes
  • data structure
  • digital circuits
  • data mining
  • machine learning
  • graphical models