Rectangular Amplitude Mask-Based Auto-Focus Method with a Large Range and High Precision for a Micro-LED Wafer Defects Detection System.
Wenjun HeYufeng MaWenbo WangPublished in: Sensors (2023)
Keyphrases
- high precision
- high recall
- detection method
- high accuracy
- high reliability
- objective function
- synthetic data
- computational cost
- object detection
- dynamic programming
- cost function
- significant improvement
- experimental evaluation
- learning algorithm
- detection algorithm
- face detection
- multiresolution
- segmentation method
- pairwise
- false positive rate
- computational complexity
- manufacturing process
- decision trees