Login / Signup

Numerical Analysis of the Feldkamp-Davis-Kress Effect on Industrial X-Ray Computed Tomography for Dimensional Metrology.

Lin XueHiromasa SuzukiYutaka OhtakeHiroyuki FujimotoMakoto AbeOsamu SatoToshiyuki Takatsuji
Published in: J. Comput. Inf. Sci. Eng. (2015)
Keyphrases