Numerical Analysis of the Feldkamp-Davis-Kress Effect on Industrial X-Ray Computed Tomography for Dimensional Metrology.
Lin XueHiromasa SuzukiYutaka OhtakeHiroyuki FujimotoMakoto AbeOsamu SatoToshiyuki TakatsujiPublished in: J. Comput. Inf. Sci. Eng. (2015)