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Test Set Generation for Multiple Faults in Boolean Systems using SAT Solver.

P. Partha KoundinyaSai Krishna Reddy YV. Mani DeepakK. RutweshAnuj Deshpande
Published in: ICCCNT (2021)
Keyphrases
  • test set
  • sat solvers
  • multiple faults
  • error rate
  • training set
  • training data
  • fault diagnosis
  • neural network
  • expert systems
  • orders of magnitude
  • data sets
  • genetic algorithm
  • state space
  • sat solving