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Test Set Generation for Multiple Faults in Boolean Systems using SAT Solver.
P. Partha Koundinya
Sai Krishna Reddy Y
V. Mani Deepak
K. Rutwesh
Anuj Deshpande
Published in:
ICCCNT (2021)
Keyphrases
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test set
sat solvers
multiple faults
error rate
training set
training data
fault diagnosis
neural network
expert systems
orders of magnitude
data sets
genetic algorithm
state space
sat solving