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A Self-Test Framework for Detecting Fault-induced Accuracy Drop in Neural Network Accelerators.

Fanruo MengFateme S. HosseiniChengmo Yang
Published in: ASP-DAC (2021)
Keyphrases
  • neural network
  • fault diagnosis
  • main contribution
  • computational cost
  • pattern recognition
  • error rate
  • machine learning
  • high accuracy
  • lightweight
  • fault detection