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Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits.

Yoshinobu HigamiKewal K. SalujaHiroshi TakahashiShin-ya KobayashiYuzo Takamatsu
Published in: ASP-DAC (2006)
Keyphrases
  • high speed
  • logic circuits
  • statistical significance
  • databases
  • database systems
  • expert systems
  • asynchronous circuits
  • genetic algorithm
  • artificial neural networks
  • feature vectors
  • vector space
  • diagnostic tests