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A holistic analysis of circuit timing variations in 3D-ICs with thermal and TSV-induced stress considerations.

Sravan K. MarellaSanjay V. KumarSachin S. Sapatnekar
Published in: ICCAD (2012)
Keyphrases
  • learning algorithm
  • artificial neural networks
  • statistical analysis
  • image processing
  • high speed
  • infrared
  • real time
  • machine learning
  • decision trees
  • data analysis
  • quantitative analysis
  • finite element analysis