Mechanical Strain Measurements Using Semiconductor Piezoresistive Material.

Ahmed A. S. Mohammed Walied A. Moussa Edmond Lou

Published in: ICMENS (2006)

Keyphrases

mechanical properties
material properties
database
measurement noise
semiconductor manufacturing
measurement errors
computer vision
data sets
machine learning
genetic algorithm
clustering algorithm
time of flight
mechanical design
quasi static
silicon dioxide
gallium arsenide