PBTI and HCI degradations of ultrathin body InGaAs-On-Insulator nMOSFETs fabricated by wafer bonding.
Xiaoyu TangJ. LuRui ZhangYi ZhaoWangran WuChang LiuYi ShiZiqian HuangYuechan KongPublished in: IRPS (2015)
Keyphrases
- human computer interaction
- high speed
- human computer interface
- human body
- image quality
- integrated circuit
- electron beam
- semiconductor manufacturing
- gesture recognition
- physiological parameters
- atmospheric turbulence
- high temperature
- room temperature
- interaction design
- image acquisition
- software engineering
- case study
- human computer
- massively parallel
- x ray
- computer vision
- learning algorithm