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Datasets and Benchmarks for Densely Sampled 4D Light Fields.

Sven WannerStephan MeisterBastian Goldluecke
Published in: VMV (2013)
Keyphrases
  • densely sampled
  • light field
  • sift descriptors
  • sift features
  • multi view
  • image formation
  • super resolution
  • face recognition across pose
  • pattern recognition
  • active learning
  • computer vision
  • single image