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Chip-packaging interaction: a critical concern for Cu/low k packaging.

Guotao WangPaul S. HoSteven Groothuis
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • high density
  • high speed
  • neural network
  • design process
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  • database
  • information retrieval
  • artificial intelligence
  • case study
  • high levels
  • single chip
  • physical design
  • low power consumption