A Statistical Model for Assessing the Fault Tolerance of Variable Switching Currents for a 1Gb Spin Transfer Torque Magnetoresistive Random Access Memory.
Yoshiaki AsaoMasayoshi IwayamaKenji TsuchidaAkihiro NitayamaHiroaki YodaHisanori AikawaSumio IkegawaTatsuya KishiPublished in: DFT (2008)
Keyphrases
- statistical model
- fault tolerance
- random access memory
- fault tolerant
- statistical models
- distributed systems
- design considerations
- load balancing
- response time
- peer to peer
- mobile agents
- low voltage
- high speed
- high performance computing
- single point of failure
- databases
- facial shape
- sensor data
- management system
- video sequences