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Three-Dimensional Voids Simulation in chip Metallization Structures: a Contribution to Reliability Evaluation.
David Dalleau
Kirsten Weide-Zaage
Published in:
Microelectron. Reliab. (2001)
Keyphrases
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three dimensional
reliability assessment
simulation model
low cost
evaluation method
mathematical model
data sets
genetic algorithm
high speed
medical images
virtual reality
simulation study
integrated circuit
simulation models
single chip
internal structures