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Transient thermal analysis for accelerated reliability testing of LEDs.
Gordon Elger
Dominik Müller
Alexander Hanß
Maximilian Schmid
E. Liu
Udo Karbowski
Robert Derix
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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statistical analysis
data analysis
reliability analysis
neural network
information systems
decision making
expert systems
information technology
image analysis
markov chain
infrared
steady state