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Design and simulation of atomic force profiling of high aspect ratio samples using 2D subresonant force spectroscopy.
J. J. Benjamin Biemond
Rodolf W. Herfst
Samaneh Mashaghi
Bert Dekker
Tom Bijnagte
Hamed Sadeghian
Published in:
AIM (2018)
Keyphrases
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aspect ratio
optical flow
image classification
training samples
training examples