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Investigation of Scaling Effect of Copper Microwire Based on in-Situ Nanorobotic Twisting Inside SEM.

Haojian LuFengmei XueWenfeng WanYajing Shen
Published in: ICRA (2018)
Keyphrases
  • thin film
  • expert systems
  • multiresolution
  • data sets
  • information retrieval
  • website
  • support vector
  • computational complexity
  • digital libraries
  • digital forensics
  • negative impact
  • scaling function