Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 mum CMOS bipolar transistors.
P. BenoitJ. RaoultC. DelsenyFabien PascalL. SnadnyJ. C. VildeuilM. MarinB. MartinetD. CottinOlivier NoblancPublished in: Microelectron. Reliab. (2005)
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