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Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors.

Athanasios DimakosHaralampos-G. D. StratigopoulosAlexandre SiligarisSalvador MirEmeric de Foucauld
Published in: J. Electron. Test. (2015)
Keyphrases
  • data fusion
  • real time
  • radio frequency
  • signal strength
  • sensor data
  • genetic algorithm
  • artificial intelligence
  • sensor networks
  • data acquisition
  • software testing
  • sensor technology