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Analysis of FinFET technology on memories.

Esteve AmatA. AsenovRamon CanalB. ChengJ.-Ll. CruzZoran JaksicMiguel MirandaAntonio RubioPaul Zuber
Published in: IOLTS (2012)
Keyphrases
  • case study
  • cost effective
  • future development
  • multiscale
  • search algorithm
  • image analysis
  • information processing
  • automatic analysis