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Characterization and modeling of run-time techniques for leakage power reduction.

Yuh-Fang TsaiD. E. DuarteNarayanan VijaykrishnanMary Jane Irwin
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2004)
Keyphrases
  • power reduction
  • power consumption
  • pattern recognition
  • low power
  • image processing
  • markov random field
  • power dissipation