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Few Good Frequencies for Power-Constrained Test.

Sindhu GunasekarVishwani D. Agrawal
Published in: VLSI Design (2015)
Keyphrases
  • neural network
  • power consumption
  • machine learning
  • statistical tests
  • real time
  • databases
  • artificial intelligence
  • case study
  • multi agent systems
  • lower bound
  • computational power