The Logarithmic Checking Method for On-Line Testing of Computing Circuits for Processing of the Approximated Data.
Alexander V. DrozdR. Al-AzzehJ. V. DrozdM. V. LobachevPublished in: DSD (2004)
Keyphrases
- synthetic data
- test data
- data sets
- noisy data
- input data
- data collection
- data processing
- data distribution
- detection method
- pairwise
- data analysis
- statistical methods
- correlation analysis
- original data
- missing data
- clustering method
- training samples
- statistical analysis
- prior knowledge
- significant improvement
- cost function
- image data
- segmentation method
- information loss
- probabilistic model
- training data
- data points
- objective function
- feature extraction
- high dimensional data
- high accuracy
- image segmentation
- missing values
- data mining techniques
- linear combination
- feature selection
- statistical tests
- database