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A low-noise, process-variation-tolerant double-gate FinFET based sense amplifier.
Surendra S. Rathod
Ashok K. Saxena
Sudeb Dasgupta
Published in:
Microelectron. Reliab. (2011)
Keyphrases
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machine learning
information retrieval
image segmentation
multiscale
low cost
input data
design process
frequency domain
process model
noisy data
noise model
random noise
high sensitivity