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Experimental Verification of Power Supply Noise Modeling for EMI Analysis through On-Board and On-Chip Noise Measurements.

Kouji IchikawaYuki TakahashiMakoto Nagata
Published in: IEICE Trans. Electron. (2007)
Keyphrases
  • power supply
  • experimental verification
  • low cost
  • low power
  • genetic algorithm
  • pattern recognition
  • high power
  • state space
  • high speed
  • fuzzy systems