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Microprocessor: An Array Built-In Self-Test Mechanism.

Craig HunterJeff SlatonJim EnoRomesh M. JessaniCarl Dietz
Published in: ITC (1994)
Keyphrases
  • high speed
  • selection mechanism
  • built in self test
  • functional verification
  • genetic algorithm
  • image processing
  • multiscale
  • search algorithm
  • infrared
  • input output
  • integrated circuit
  • mechanism design
  • focal plane