Outliers in statistical pattern recognition and an application to automatic chromosome classification.
Gunter RitterMaría Teresa GallegosPublished in: Pattern Recognit. Lett. (1997)
Keyphrases
- statistical pattern recognition
- reject option
- pattern recognition
- fully automatic
- feature extraction
- classification accuracy
- machine learning
- feature vectors
- automatic classification
- denoising
- outlier detection
- support vector machine svm
- classification method
- data sets
- benchmark datasets
- semi automatic
- text classification
- rough sets
- support vector
- pattern classification
- learning algorithm
- features extraction
- genetic algorithm
- text categorisation
- statistical classification
- data mining