Comprehensive Circuit Failure Prediction for Logic and SRAM Using Virtual Aging.
Amir YazdanbakhshRaghuraman BalasubramanianTony NowatzkiKarthikeyan SankaralingamPublished in: IEEE Micro (2015)
Keyphrases
- failure prediction
- logic synthesis
- delay insensitive
- digital circuits
- random access memory
- logic circuits
- low voltage
- low power
- power consumption
- multi valued
- high speed
- power reduction
- virtual environment
- asynchronous circuits
- chip design
- virtual world
- virtual reality
- logic programming
- micron cmos
- truth table
- circuit design
- civil engineering
- data transmission
- augmented reality
- cmos technology
- image processing
- modal logic
- fault diagnosis
- expert systems