A Novel Approach for Analog Circuit Fault Prognostics Based on Improved RVM.

Chaolong Zhang Yigang He Lifen Yuan Fangming Deng

Published in: J. Electron. Test. (2014)

Keyphrases

fault diagnosis
analog circuits
fault detection
expert systems
neural network
fuzzy logic
xml documents
data model
relevance vector machines
feature extraction
low cost
bayesian learning