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A Novel Approach for Analog Circuit Fault Prognostics Based on Improved RVM.

Chaolong ZhangYigang HeLifen YuanFangming Deng
Published in: J. Electron. Test. (2014)
Keyphrases
  • fault diagnosis
  • analog circuits
  • fault detection
  • expert systems
  • neural network
  • fuzzy logic
  • xml documents
  • data model
  • relevance vector machines
  • feature extraction
  • low cost
  • bayesian learning