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Three-dimensional defect sensitivity modeling for open circuits in ULSI structures.
M. K. Kidambi
Akhilesh Tyagi
Mohammed R. Madani
Magdy A. Bayoumi
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1998)
Keyphrases
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three dimensional
internal structures
databases
object modeling
structural analysis
x ray
neural network
database
image sequences
multi agent
artificial neural networks
multi view
information systems
range images
sensitivity analysis
modeling framework
artificial intelligence
defect detection