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Analysis of implant parameters in high voltage TRIPLE RESURF LDMOS for advanced SoC applications.

B. Jhnanesh SomayajiM. S. Bhat
Published in: ISED (2016)
Keyphrases
  • high voltage
  • real time
  • artificial neural networks
  • learning algorithm
  • data analysis
  • association rules
  • search space
  • low cost
  • genetic programming